会議情報
ISSTA 2026: International Symposium on Software Testing and Analysis
https://conf.researchr.org/home/issta-2026提出日: |
2026-01-29 |
通知日: |
2026-06-25 |
会議日: |
2026-10-03 |
場所: |
Oakland, California, USA |
年: |
35 |
CCF: a CORE: a QUALIS: a2 閲覧: 108493 追跡: 104 出席: 13
論文募集
Research Areas ISSTA welcomes submissions addressing topics across the full spectrum of software analysis. Topics of interest include the following and are grouped into the following eight research areas. Please note that these topics are by no means exhaustive. Each submission will need to indicate one primary and optionally a secondary area. Program chairs will ultimately assign a paper to an area chair (and at least three reviewers), considering the authors’ selection, the paper’s content, and other factors such as (if applicable) possible conflicts of interest. AI for Analysis and Testing Agentic or LLM-based specification inference Agentic or LLM-based code generation Agentic or LLM-based software testing Agentic of LLM-based program analysis Agentic or LLM-based program repair Analysis and Testing for AI Testing and analysis of agents or agentic systems Testing and analysis of ML-model/software hybrid systems Testing and analysis of ML-components and libraries Fairness, safety, trustworthiness Software Test Generation Regression, mutation, and model-based testing System, unit, and integration testing Black-, grey-, and white-box fuzzing Search-based software testing Symbolic and concolic execution Software Debugging and Repair Fault localization and debugging Search-based program repair Constraint-based program repair Reverse engineering Program comprehension Specification inference Software Verification and Analysis Techniques Static, dynamic, and empirical program analysis Program verification, runtime verification, and model checking Refactoring, transformation, and reduction Testing and analysis in CI/CD or deployment Testing and analysis of evolving systems Mutation testing and analysis Ecosystem-scale analysis Non-functional properties (dependability, safety, reliability, and performance) Analysis and Testing for Security Binary analysis, lifting, and instrumentation Vulnerability detection (e.g., sanitizers) Side channels and data leakage Supply chain analysis Malware analysis Obfuscation Domain-specific Analysis and Testing Testing and analysis of blockchain systems or smart contracts Testing and analysis of concurrent or distributed systems Testing and analysis of cyber physical or autonomous systems Testing and analysis of database or operating systems Testing and analysis of numerical and scientific applications Testing and analysis of testing or analysis tools Testing and analysis of web, mobile, or quantum applications Empirical and User Studies of Testing and Analysis Processes Software engineering processes (e.g., agile, DevOps) Green and sustainable technologies Ethics and values Software economics Systematic code review and inspection Program comprehension and visualization
最終更新 Dou Sun 2025-10-02
合格率
時間 | 提出 | 受け入れ | 受け入れ(%) |
---|---|---|---|
2014 | 128 | 36 | 28.1% |
2013 | 124 | 32 | 25.8% |
2012 | 108 | 31 | 28.7% |
2011 | 121 | 35 | 28.9% |
2010 | 105 | 24 | 22.9% |
2009 | 93 | 25 | 26.9% |
2008 | 100 | 35 | 35% |
2007 | 103 | 22 | 21.4% |
2006 | 84 | 22 | 26.2% |
2004 | 93 | 28 | 30.1% |
2002 | 97 | 26 | 26.8% |
2000 | 73 | 21 | 28.8% |
1998 | 47 | 16 | 34% |
1996 | 69 | 24 | 34.8% |
ベスト ペーパー
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関連仕訳帳
CCF | 完全な名前 | インパクト ・ ファクター | 出版社 | ISSN |
---|---|---|---|---|
Nano Today | 10.9 | Elsevier | 1748-0132 | |
Foundations and Trends in Machine Learning | Now Publishers Inc. | 1935-8237 | ||
Journal of Computational Electronics | 2.200 | Springer | 1569-8025 | |
Diamond and Related Materials | 4.300 | Elsevier | 0925-9635 | |
c | EURASIP Journal on Information Security | 2.500 | Springer | 1687-417X |
Discover Applied Sciences | 2.800 | Springer | 3004-9261 | |
Systems & Control Letters | 2.100 | Elsevier | 0167-6911 | |
Forensic Science International: Digital Investigation | 2.000 | Elsevier | 2666-2825 | |
Journal of Computational Design and Engineering | 4.800 | Oxford | 2288-4300 | |
Journal of Computer Languages | 1.700 | Elsevier | 2665-9182 |
完全な名前 | インパクト ・ ファクター | 出版社 |
---|---|---|
Nano Today | 10.9 | Elsevier |
Foundations and Trends in Machine Learning | Now Publishers Inc. | |
Journal of Computational Electronics | 2.200 | Springer |
Diamond and Related Materials | 4.300 | Elsevier |
EURASIP Journal on Information Security | 2.500 | Springer |
Discover Applied Sciences | 2.800 | Springer |
Systems & Control Letters | 2.100 | Elsevier |
Forensic Science International: Digital Investigation | 2.000 | Elsevier |
Journal of Computational Design and Engineering | 4.800 | Oxford |
Journal of Computer Languages | 1.700 | Elsevier |