会議情報
ICST 2025: International Conference on Software Testing, Verification and Validation
https://conf.researchr.org/home/icst-2025提出日: |
2024-09-18 |
通知日: |
2024-12-11 |
会議日: |
2025-03-31 |
場所: |
Naples, Italy |
年: |
18 |
CCF: c CORE: a QUALIS: b2 閲覧: 38072 追跡: 79 出席: 15
論文募集
ICST 2025 invites high-quality submissions in all software testing, verification, and validation areas. Topics of interest include, but are not limited to, the following: AI-assisted software testing Automated test generation Formal verification Manual and social aspects of the software testing process Replications, empirical studies, case studies, experience reports Software reliability Static and dynamic analysis Test automation Test-driven development and Agile testing Testability, test design, and adequacy criteria Testing AI-based systems Testing and development processes Testing, debugging, and repair tools Testing education Testing in specific domains, such as mobile, web, embedded/cyber-physical systems, concurrent, distributed, cloud, GUI, context-aware, IoT, real-time systems, video games, augmented/virtual reality applications Testing of non-functional properties such as security, accessibility, and performance Theory of software testing Validation and user acceptance techniques Papers for the research track should present novel and original work that advances the state-of-the-art. Case studies, replication studies, and empirical research papers are also welcome. Papers with a strong industrial/practical component and focus more on impact than (technical) novelty are encouraged to consider the industry track instead.
最終更新 Dou Sun 2024-07-06
合格率
時間 | 提出 | 受け入れ | 受け入れ(%) |
---|---|---|---|
2012 | 145 | 39 | 26.9% |
2010 | 154 | 41 | 26.6% |
2008 | 147 | 37 | 25.2% |
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関連仕訳帳
CCF | 完全な名前 | インパクト ・ ファクター | 出版社 | ISSN |
---|---|---|---|---|
Nano Today | 10.9 | Elsevier | 1748-0132 | |
Foundations and Trends in Machine Learning | Now Publishers Inc. | 1935-8237 | ||
ETRI Journal | 1.300 | Wiley-Blackwell | 1225-6463 | |
c | Journal of Electronic Testing: Theory and Applications | 1.100 | Springer | 0923-8174 |
c | EURASIP Journal on Information Security | 2.500 | Springer | 1687-417X |
Systems Science & Control Engineering | Taylor & Francis | 2164-2583 | ||
a | Proceedings of the IEEE | 25.9 | IEEE | 0018-9219 |
c | Computer Communications | 4.500 | Elsevier | 0140-3664 |
c | IEEE Transactions on Network and Service Management | 4.700 | IEEE | 1932-4537 |
Digital Signal Processing | 2.900 | Elsevier | 1051-2004 |
完全な名前 | インパクト ・ ファクター | 出版社 |
---|---|---|
Nano Today | 10.9 | Elsevier |
Foundations and Trends in Machine Learning | Now Publishers Inc. | |
ETRI Journal | 1.300 | Wiley-Blackwell |
Journal of Electronic Testing: Theory and Applications | 1.100 | Springer |
EURASIP Journal on Information Security | 2.500 | Springer |
Systems Science & Control Engineering | Taylor & Francis | |
Proceedings of the IEEE | 25.9 | IEEE |
Computer Communications | 4.500 | Elsevier |
IEEE Transactions on Network and Service Management | 4.700 | IEEE |
Digital Signal Processing | 2.900 | Elsevier |