Información de la conferencia
ICST 2025: International Conference on Software Testing, Verification and Validation
https://conf.researchr.org/home/icst-2025Día de Entrega: |
2024-09-18 |
Fecha de Notificación: |
2024-12-11 |
Fecha de Conferencia: |
2025-03-31 |
Ubicación: |
Naples, Italy |
Años: |
18 |
CCF: c CORE: a QUALIS: b2 Vistas: 38073 Seguidores: 79 Asistentes: 15
Solicitud de Artículos
ICST 2025 invites high-quality submissions in all software testing, verification, and validation areas. Topics of interest include, but are not limited to, the following: AI-assisted software testing Automated test generation Formal verification Manual and social aspects of the software testing process Replications, empirical studies, case studies, experience reports Software reliability Static and dynamic analysis Test automation Test-driven development and Agile testing Testability, test design, and adequacy criteria Testing AI-based systems Testing and development processes Testing, debugging, and repair tools Testing education Testing in specific domains, such as mobile, web, embedded/cyber-physical systems, concurrent, distributed, cloud, GUI, context-aware, IoT, real-time systems, video games, augmented/virtual reality applications Testing of non-functional properties such as security, accessibility, and performance Theory of software testing Validation and user acceptance techniques Papers for the research track should present novel and original work that advances the state-of-the-art. Case studies, replication studies, and empirical research papers are also welcome. Papers with a strong industrial/practical component and focus more on impact than (technical) novelty are encouraged to consider the industry track instead.
Última Actualización Por Dou Sun en 2024-07-06
Coeficiente de Aceptación
Año | Enviados | Aceptados | Aceptados(%) |
---|---|---|---|
2012 | 145 | 39 | 26.9% |
2010 | 154 | 41 | 26.6% |
2008 | 147 | 37 | 25.2% |
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Revistas Relacionadas
CCF | Nombre Completo | Factor de Impacto | Editor | ISSN |
---|---|---|---|---|
Nano Today | 10.9 | Elsevier | 1748-0132 | |
Foundations and Trends in Machine Learning | Now Publishers Inc. | 1935-8237 | ||
ETRI Journal | 1.300 | Wiley-Blackwell | 1225-6463 | |
c | Journal of Electronic Testing: Theory and Applications | 1.100 | Springer | 0923-8174 |
c | EURASIP Journal on Information Security | 2.500 | Springer | 1687-417X |
Systems Science & Control Engineering | Taylor & Francis | 2164-2583 | ||
a | Proceedings of the IEEE | 25.9 | IEEE | 0018-9219 |
c | Computer Communications | 4.500 | Elsevier | 0140-3664 |
c | IEEE Transactions on Network and Service Management | 4.700 | IEEE | 1932-4537 |
Digital Signal Processing | 2.900 | Elsevier | 1051-2004 |
Nombre Completo | Factor de Impacto | Editor |
---|---|---|
Nano Today | 10.9 | Elsevier |
Foundations and Trends in Machine Learning | Now Publishers Inc. | |
ETRI Journal | 1.300 | Wiley-Blackwell |
Journal of Electronic Testing: Theory and Applications | 1.100 | Springer |
EURASIP Journal on Information Security | 2.500 | Springer |
Systems Science & Control Engineering | Taylor & Francis | |
Proceedings of the IEEE | 25.9 | IEEE |
Computer Communications | 4.500 | Elsevier |
IEEE Transactions on Network and Service Management | 4.700 | IEEE |
Digital Signal Processing | 2.900 | Elsevier |