Journal Information
Proceedings of the IEEE (Proc. IEEE)
https://proceedingsoftheieee.ieee.org/Impact Factor: |
25.9 |
Publisher: |
IEEE |
ISSN: |
0018-9219 |
Viewed: |
24720 |
Tracked: |
24 |
Call For Papers
One of the Most Influential Reference Resources for Engineers Around the World Proceedings of the IEEE is the leading journal to provide in-depth review, survey, and tutorial coverage of the technical developments in electronics, electrical and computer engineering, and computer science. Consistently ranked as one of the top journals by Impact Factor, Article Influence Score and more, the journal serves as a trusted resource for engineers around the world. Also referred to as the Proceedings, or IEEE Proceedings, the journal offers applications-oriented coverage that goes beyond the traditional boundaries typically found in other journals to provide readers with a broader technical perspective for professional growth, enrichment, and development. Areas Covered The Proceedings covers all important technical developments in the areas of electronics, electrical and computer engineering, and computer science. From Big Data to Plasmonics, Cyber-Physical Systems, to Power and Energy, Proceedings papers provide a survey, review, or tutorial treatment of the subject. Stay informed with Proceedings of the IEEE Annually, the Proceedings publishes twelve issues which are available electronically and in print. The monthly issues provide state-of-the-art coverage of a current hot topic (special issues/sections), or address multiple emerging areas of interest through focused articles. The survey, review, tutorial style coverage is highly valued by the core research community, as well as specialists in other areas, looking to quickly come up to speed on the latest and more promising advances in areas outside of their own expertise. Our webinars series complements the special issue content and offers researchers a platform to engage with leading experts in many different fields. The journal also offers thought provoking articles through its Point of View feature and celebrates the history of technology and the people associated with it through its Scanning Our Past feature.
Last updated by Dou Sun in 2025-08-02
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| Full Name | Impact Factor | Publisher |
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| Proceedings of the IEEE | 25.9 | IEEE |
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| Processes | 2.800 | MDPI |
| Proceedings of the ACM on Software Engineering | ACM | |
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| Short | Full Name | Conference |
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