Información de la conferencia
DATE 2025: Design, Automation and Test in Europe
https://www.date-conference.com/
Día de Entrega:
2024-09-15
Fecha de Notificación:
Fecha de Conferencia:
2025-03-31
Ubicación:
Lyon, France
Años:
28
CCF: b   CORE: b   QUALIS: a1   Vistas: 183027   Seguidores: 148   Asistentes: 24

Solicitud de Artículos
Areas of Interest

Within the scope of the conference, the main areas of interest are: design automation, design tools and hardware architectures for electronic and embedded systems; test and dependability at system, chip, circuit and device level for analogue and digital electronics; modelling, analysis, design and deployment of embedded software and cyber-physical systems; application design and industrial design experiences. Topics of interest include, but are not restricted to:

    Quantum Computing Solutions
    System-level design methodologies and high-level synthesis
    System simulation and validation
    Design and test for analogue and mixed-signal circuits and systems, and MEMS
    Design and test of hardware security primitives
    Design and test of secure systems
    Formal methods and verification
    Network on chip and on-chip communication
    Architectural and microarchitectural design
    Low-power, energy-efficient and thermal-aware design
    Approximate computing
    Reconfigurable systems
    Logical analysis and design
    Physical analysis and design
    Emerging design technologies for future computing
    Emerging design technologies for future memories
    Power-efficiency and Smart Energy Systems for Sustainable Computing
    Smart Society and Digital Wellness
    Secure Systems, Circuits and Architectures
    Autonomous Systems and Smart Industry
    Applications of Emerging Technologies
    Applications of Artificial Intelligence Systems
    Applications of Emerging Technologies
    Modelling and mitigation of defects, faults, variability, and reliability
    Test generation, test architectures, design for test, and diagnosis
    Dependability and system-level test
    Embedded software architecture, compilers and tool chains
    Real-time, dependable and privacy-enhanced systems
    Machine learning solutions for embedded and cyber-physical systems
    Design methodologies for machine learning architectures
    Design modelling and verification for embedded and cyber-physical systems
Última Actualización Por Dou Sun en 2024-07-31
Coeficiente de Aceptación
AñoEnviadosAceptadosAceptados(%)
200683426732%
200582517621.3%
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