Basic Information
Name: Jian Hu
Institution: National University of Defense Technology
Registration: 2019-06-24
Score: 629
Tracked Conferences
| CCF | CORE | QUALIS | Short | Full Name | Submission | Notification | Conference |
|---|---|---|---|---|---|---|---|
| CSAE | International Conference on Computer Science and Application Engineering | 2023-07-20 | 2023-10-17 | ||||
| c | a | a2 | CASES | International Conference on Compilers, Architectures, and Synthesis for Embedded Systemsing | 2023-03-16 | 2023-06-30 | 2023-09-17 |
| ICISCA | International Conference of Information Science and Computer Applications | 2022-07-20 | 2022-07-25 | 2022-09-23 | |||
| AUTEEE | IEEE International Conference on Automation, Electronics and Electrical Engineering | 2020-08-30 | 2020-09-15 | 2020-11-20 |
Go to page:
| Short | Full Name | Submission | Conference |
|---|---|---|---|
| CSAE | International Conference on Computer Science and Application Engineering | 2023-07-20 | 2023-10-17 |
| CASES | International Conference on Compilers, Architectures, and Synthesis for Embedded Systemsing | 2023-03-16 | 2023-09-17 |
| ICISCA | International Conference of Information Science and Computer Applications | 2022-07-20 | 2022-09-23 |
| AUTEEE | IEEE International Conference on Automation, Electronics and Electrical Engineering | 2020-08-30 | 2020-11-20 |
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Attend Conferences
| CCF | CORE | QUALIS | Short | Full Name | Conference | Location |
|---|---|---|---|---|---|---|
| No results found. | ||||||
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Tracked Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| Electronic Notes in Theoretical Computer Science | Elsevier | 1571-0661 | ||
| c | Integration, the VLSI Journal | 2.200 | Elsevier | 0167-9260 |
| c | Future Generation Computer Systems | 6.200 | Elsevier | 0167-739X |
| c | Journal of Electronic Testing: Theory and Applications | 1.100 | Springer | 0923-8174 |
| Full Name | Impact Factor | Publisher |
|---|---|---|
| Electronic Notes in Theoretical Computer Science | Elsevier | |
| Integration, the VLSI Journal | 2.200 | Elsevier |
| Future Generation Computer Systems | 6.200 | Elsevier |
| Journal of Electronic Testing: Theory and Applications | 1.100 | Springer |
Followed Researchers
| Name | Institution | Registration | Score |
|---|---|---|---|
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Tracked Jobs
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Viewed Conferences
| CCF | CORE | QUALIS | Short | Full Name | Submission | Notification | Conference |
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| Short | Full Name | Submission | Conference |
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| No results found. | |||
Viewed Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| No results found. | ||||
| Full Name | Impact Factor | Publisher |
|---|---|---|
| No results found. | ||