期刊信息
Computers, Materials & Continua (CMC)
https://www.techscience.com/cmc/index.html影响因子: |
2.000 |
出版商: |
Tech Science Press |
ISSN: |
1546-2218 |
浏览: |
16656 |
关注: |
1 |
征稿
This journal publishes original research papers in the areas of computer networks, artificial intelligence, big data management, software engineering, multimedia, cyber security, internet of things, materials genome, integrated materials science, data analysis, modeling, and engineering of designing and manufacturing of modern functional and multifunctional materials. Novel high performance computing methods, big data analysis, and artificial intelligence that advance material technologies are especially welcome.
最后更新 Dou Sun 在 2024-08-11
相关期刊
CCF | 全称 | 影响因子 | 出版商 | ISSN |
---|---|---|---|---|
IT Professional | 2.200 | IEEE | 1520-9202 | |
c | International Journal of Uncertainty, Fuzziness and Knowledge-Based Systems | World Scientific | 0218-4885 | |
c | Natural Computing | 1.700 | Springer | 1567-7818 |
Semiconductor Science and Technology | 1.900 | IOP Publishing | 1361-6641 | |
Digital Communications and Networks | 7.5 | Elsevier | 2352-8648 | |
Computer Assisted Language Learning | 6.000 | Taylor & Francis | 0958-8221 | |
b | IEEE Transactions on Systems, Man, and Cybernetics: Systems | 8.7 | IEEE | 2168-2216 |
c | Natural Language Engineering | 2.500 | Cambridge University Press | 1351-3249 |
c | Pattern Analysis and Applications | 3.700 | Springer | 1433-7541 |
c | IEEE Geoscience and Remote Sensing Letters | 4.000 | IEEE | 1545-598X |
全称 | 影响因子 | 出版商 |
---|---|---|
IT Professional | 2.200 | IEEE |
International Journal of Uncertainty, Fuzziness and Knowledge-Based Systems | World Scientific | |
Natural Computing | 1.700 | Springer |
Semiconductor Science and Technology | 1.900 | IOP Publishing |
Digital Communications and Networks | 7.5 | Elsevier |
Computer Assisted Language Learning | 6.000 | Taylor & Francis |
IEEE Transactions on Systems, Man, and Cybernetics: Systems | 8.7 | IEEE |
Natural Language Engineering | 2.500 | Cambridge University Press |
Pattern Analysis and Applications | 3.700 | Springer |
IEEE Geoscience and Remote Sensing Letters | 4.000 | IEEE |
相关会议