Conference Information
ISSSR 2024: International Symposium on System Security, Safety, and Reliability
https://isssr24.techconf.org/Submission Date: |
2024-02-01 Extended |
Notification Date: |
2024-03-01 |
Conference Date: |
2024-03-30 |
Location: |
Xiamen, China |
Years: |
10 |
Viewed: 7302 Tracked: 1 Attend: 0
Call For Papers
Topics of interest include, but are not limited to, the following that focus on system security, safety, and reliability:
Requirements, Architecture, and Design
Measurement, Estimation, and Predication
Modeling and Optimization
Analysis, Simulation, and Validation
Formalization and Verification
Testing and Quality Assurance
Fault Tolerance and Diagnosis
Process Improvement and Maintenance
Redundancy and Performance Evaluation
Data-Driven and AI/Machine Learning Techniques
Benchmark and Tools
Industrial Applications and Empirical Studies
Last updated by Lu Jing in 2024-01-07
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Related Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| c | IEEE Transactions on Reliability | 5.7 | IEEE | 0018-9529 |
| Virtual Reality | 5.0 | Springer | 1359-4338 | |
| IEEE Systems Journal | 4.4 | IEEE | 1932-8184 | |
| c | Journal of Information Security and Applications | 3.7 | Elsevier | 2214-2126 |
| Sustainability | 3.3 | MDPI | 2071-1050 | |
| Computer Law & Security Review | 3.2 | Elsevier | 0267-3649 | |
| c | Computer Law and Security Review | 3.2 | Elsevier | 0267-3649 |
| Microelectronics Reliability | 1.600 | Elsevier | 0026-2714 | |
| b | Software Testing, Verification and Reliability | 1.500 | John Wiley & Sons, Ltd | 1099-1689 |
| Software Testing Verification and Reliability | 1.500 | Wiley-Blackwell | 0960-0833 |
| Full Name | Impact Factor | Publisher |
|---|---|---|
| IEEE Transactions on Reliability | 5.7 | IEEE |
| Virtual Reality | 5.0 | Springer |
| IEEE Systems Journal | 4.4 | IEEE |
| Journal of Information Security and Applications | 3.7 | Elsevier |
| Sustainability | 3.3 | MDPI |
| Computer Law & Security Review | 3.2 | Elsevier |
| Computer Law and Security Review | 3.2 | Elsevier |
| Microelectronics Reliability | 1.600 | Elsevier |
| Software Testing, Verification and Reliability | 1.500 | John Wiley & Sons, Ltd |
| Software Testing Verification and Reliability | 1.500 | Wiley-Blackwell |