会议信息
Sarnoff 2019: IEEE Sarnoff Symposium
https://ewh.ieee.org/conf/sarnoff/2019/截稿日期: |
2019-07-01 Extended |
通知日期: |
2019-08-19 |
会议日期: |
2019-09-23 |
会议地点: |
Newark, New Jersey, USA |
届数: |
40 |
浏览: 12050 关注: 0 参加: 0
征稿
Since 1978, the IEEE Sarnoff Symposium has been bringing together telecom and communications experts from industry, universities, and governments. The Sarnoff Symposium continues to grow as a premier forum in the northeastern United States for researchers, engineers, and business executives, drawing an attendance from all over the world. Besides technical sessions, the Symposium will include keynotes, invited talks, expert panels, tutorials, demo/exhibits and poster presentations. SCOPE The Symposium is soliciting state-of-the-art research papers, panels and tutorial proposals including, but not limited to, the following topics: 4G/5G Communications Network Architecture Cloud and data center networks Network Design Cognitive radio and opportunistic networks Network Performance Communications and Information Theory Internet-of-Things Cyber-physical systems and networks Optical Communications Green networking and Sustainability Optical Networking M-Health, E-Health and Smart Health-care Self Configuring Networks Mobile Networks Smart Cities and Communities Near field communications Software-Defined Networks Network Function Virtualization Standardization Efforts and Needs Cloud Computing Security, Trust, and Privacy Network architectures for Smart Infrastructures UAV, Underwater and Underground Communications Network virtualization Wireless Communications Networked Applications and Services Wireless Networks Network Analytics Wireless Sensor Networks
最后更新 Dou Sun 在 2019-06-15
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简称 | 全称 | 截稿日期 | 会议日期 |
---|---|---|---|
SEEL | International Conference on Smart Education and E-Learning | 2019-01-25 | 2019-06-17 |
ICCAC | IEEE International Conference on Cloud and Autonomic Computing | 2017-05-05 | 2017-09-18 |
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AUTOTESTCON | IEEE AUTOTESTCON | 2024-08-26 | |
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相关期刊
CCF | 全称 | 影响因子 | 出版商 | ISSN |
---|---|---|---|---|
c | IEEE Transactions on Reliability | 5.000 | IEEE | 0018-9529 |
Statistical Methodology | Elsevier | 1572-3127 | ||
Composites Communications | 6.500 | Elsevier | 2452-2139 | |
Synthetic Metals | 4.000 | Elsevier | 0379-6779 | |
Concurrent Engineering: Research and Applications | SAGE | 1063-293X | ||
TripleC | Unified Theory of Information Research Group | 1726-670X | ||
Journal of Computational Electronics | 2.200 | Springer | 1569-8025 | |
Virtual Archaeology Review | Universitad Politecnica de Valencia | 1989-9947 | ||
Journal of Chemical Information and Modeling | 5.600 | American Chemical Society | 1549-9596 | |
c | IEEE Transactions on Circuits and Systems I: Regular Papers | 5.200 | IEEE | 1549-8328 |
全称 | 影响因子 | 出版商 |
---|---|---|
IEEE Transactions on Reliability | 5.000 | IEEE |
Statistical Methodology | Elsevier | |
Composites Communications | 6.500 | Elsevier |
Synthetic Metals | 4.000 | Elsevier |
Concurrent Engineering: Research and Applications | SAGE | |
TripleC | Unified Theory of Information Research Group | |
Journal of Computational Electronics | 2.200 | Springer |
Virtual Archaeology Review | Universitad Politecnica de Valencia | |
Journal of Chemical Information and Modeling | 5.600 | American Chemical Society |
IEEE Transactions on Circuits and Systems I: Regular Papers | 5.200 | IEEE |
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