Información Básica
Nombre: Yi Liu
Institución: Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences
Registro: 2020-05-15
Puntuación: 143
CV
Conferencias Seguidas
Mostrando 1-8 de 8 elementos.
CCFCOREQUALISAbreviaciónNombre CompletoEntregaNotificaciónConferencia
baa1ECCVEuropean Conference on Computer Vision2026-03-062026-05-092026-09-08
aa*a1IJCAIInternational Joint Conference on Artificial Intelligence2026-01-312026-08-15
aa*a1CVPRIEEE Conference on Computer Vision and Pattern Recognition2025-11-062026-02-202026-06-03
aa*a1AAAIAAAI Conference on Artificial Intelligence2025-07-252025-11-032026-01-20
aa1NeurIPSConference on Neural Information Processing Systems2025-05-112025-09-182025-12-02
aa*MMACM Multimedia2025-04-042025-07-042025-10-27
aa*a1ICCVInternational Conference on Computer Vision2025-03-072025-06-252025-10-19
aa*a1ICMLInternational Conference on Machine Learning2025-01-232025-07-13
Mostrando 1-8 de 8 elementos.
Nombre CompletoEntregaConferencia
European Conference on Computer Vision2026-03-062026-09-08
International Joint Conference on Artificial Intelligence2026-01-312026-08-15
IEEE Conference on Computer Vision and Pattern Recognition2025-11-062026-06-03
AAAI Conference on Artificial Intelligence2025-07-252026-01-20
Conference on Neural Information Processing Systems2025-05-112025-12-02
ACM Multimedia2025-04-042025-10-27
International Conference on Computer Vision2025-03-072025-10-19
International Conference on Machine Learning2025-01-232025-07-13
Conferencias Asistidas
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Revistas Seguidas
Mostrando 1-8 de 8 elementos.
CCFNombre CompletoFactor de ImpactoEditorISSN
bIEEE Transactions on Neural Networks and Learning Systems8.9IEEE1045-9227
bPattern Recognition7.5Elsevier0031-3203
bIEEE Transactions on Multimedia9.7IEEE1520-9210
aIEEE Transactions on Image Processing13.7IEEE1057-7149
aJournal of Machine Learning ResearchMicrotome Publishing1532-4435
aInternational Journal of Computer Vision9.3Springer0920-5691
aArtificial Intelligence5.100Elsevier0004-3702
aIEEE Transactions on Pattern Analysis and Machine Intelligence20.8IEEE0162-8828
Investigadores Seguidos
NombreInstituciónRegistroScore
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