Información Básica
Nombre: Jian Hu
Institución: National University of Defense Technology
Registro: 2019-06-24
Puntuación: 642
CV
Conferencias Seguidas
Mostrando 11-14 de 14 elementos.
| CCF | CORE | QUALIS | Abreviación | Nombre Completo | Entrega | Notificación | Conferencia |
|---|---|---|---|---|---|---|---|
| c | a | b2 | ICST | International Conference on Software Testing, Verification and Validation | 2024-09-18 | 2024-12-11 | 2025-03-31 |
| CSAE | International Conference on Computer Science and Application Engineering | 2023-07-20 | 2023-10-17 | ||||
| ICISCA | International Conference of Information Science and Computer Applications | 2022-07-20 | 2022-07-25 | 2022-09-23 | |||
| AUTEEE | IEEE International Conference on Automation, Electronics and Electrical Engineering | 2020-08-30 | 2020-09-15 | 2020-11-20 |
Mostrando 11-14 de 14 elementos.
| Abreviación | Nombre Completo | Entrega | Conferencia |
|---|---|---|---|
| ICST | International Conference on Software Testing, Verification and Validation | 2024-09-18 | 2025-03-31 |
| CSAE | International Conference on Computer Science and Application Engineering | 2023-07-20 | 2023-10-17 |
| ICISCA | International Conference of Information Science and Computer Applications | 2022-07-20 | 2022-09-23 |
| AUTEEE | IEEE International Conference on Automation, Electronics and Electrical Engineering | 2020-08-30 | 2020-11-20 |
Conferencias Asistidas
Revistas Seguidas
Mostrando 1-4 de 4 elementos.
| CCF | Nombre Completo | Factor de Impacto | Editor | ISSN |
|---|---|---|---|---|
| Electronic Notes in Theoretical Computer Science | Elsevier | 1571-0661 | ||
| c | Integration, the VLSI Journal | 2.200 | Elsevier | 0167-9260 |
| c | Future Generation Computer Systems | 6.2 | Elsevier | 0167-739X |
| c | Journal of Electronic Testing: Theory and Applications | 1.100 | Springer | 0923-8174 |
Mostrando 1-4 de 4 elementos.
| Nombre Completo | Factor de Impacto | Editor |
|---|---|---|
| Electronic Notes in Theoretical Computer Science | Elsevier | |
| Integration, the VLSI Journal | 2.200 | Elsevier |
| Future Generation Computer Systems | 6.2 | Elsevier |
| Journal of Electronic Testing: Theory and Applications | 1.100 | Springer |
Investigadores Seguidos
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|---|---|---|---|
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| Nombre | Institución | Score |
|---|---|---|
No se encontraron resultados. | ||