Basic Information
Name: Bob SMITH
Institution: Sun Yat-sen University
Registration: 2018-11-28
Score: 297
CV
Tracked Conferences
Attend Conferences
Tracked Journals
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CCF | Full Name | Impact Factor | Publisher | ISSN |
---|---|---|---|---|
a | IEEE Transactions on Pattern Analysis and Machine Intelligence | 20.8 | IEEE | 0162-8828 |
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Full Name | Impact Factor | Publisher |
---|---|---|
IEEE Transactions on Pattern Analysis and Machine Intelligence | 20.8 | IEEE |
Followed Researchers
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