The 2017 International Conference on Security, Pattern Analysis, and Cybernetics provides an international forum that brings together those actively involved in information science and engineering, security, cybernetics, and pattern analysis, to report on up-to-the-minute innovations and developments, to summarize the state-of-the-art, and to exchange ideas and advances in all aspects of security, pattern analysis and cybernetics.

Contributions covering theoretical developments and practical applications, including but not limited to the following technical areas, are invited:

Topics:

1. Machine Learning, Pattern Analysis, Signal and Image Processing

    Image De-nosing/Restoration/Segmentation/Grouping
    Color and Texture
    Image-Based Modeling
    Shape Representation and Matching
    Shape modeling and encoding
    3D shape recovery
    Occlusion and shadow detection
    Stereo and multiple view geometry
    Reconstruction and camera motion estimation
    Object Detection/Recognition/Tracking/Categorization
    Face and Gesture Analysis
    Medical Image Analysis
    Feature Selection, Dimensionality Reduction, Manifold Learning
    Active and ensemble learning
    Deep learning
    Transfer learning
    Semi-supervised learning and spectral methods
    Model selection
    Reinforcement learning and temporal model
    Statistical/Kernel Methods and Support Vector Machines

2. Information security and Anti-Counterfeit

    Digital Watermarking
    Multidimensional Code
    Cryptography
    Network penetration
    Anti-Counterfeit Material
    Internet protocol

3. Big Data Processing and Application

    Big data storage and management, parallel computing
    Cloud computing
    Ranking and recommendation
    social networks analysis and web mining

4. Artificial intelligence and Cybernetics

    Robotics & control systems
    Fuzzy Systems and Applications
    Expert and Knowledge-Based Systems
    Cybernetics for Informatics

This conference is technical sponsored by IEEE SMC Society and all accepted full papers should be listed in IEEE Xplore. In addition, revised and extended versions of 25 selected papers will be recommended for publication in special issues of SCI indexed journals.